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NIST Tests Forensic Methods for Getting Data From Damaged Mobile Phones

NIST tests forensic methods for getting data from damaged mobile phones. Forensic experts use hardware and software tools to directly access the phones memory chips. The results of the NIST study will also help labs choose the right tools for the job, depending on the type of phone and the extent of the damage. The study addresses methods that work with Android phones. It covered only methods for accessing data, not decrypting it, but they can still be useful with encrypted phones because investigators often manage to get the passcode during their investigation.”]

Source: https://securityaffairs.co/wordpress/97088/mobile-2/nist-tests-forensics-mobile-phones.html

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