Todd Yurgin, 41, of Newark, Delaware, is sentenced to 16 years and 7 months in prison. He was sentenced Thursday for his role in a “massive” ID theft scheme, the DOJ said. The scheme resulted in a loss of nearly US$1 million to credit card-issuing financial institutions, the agency said. His sentence is the longest in Delaware history for fraud and ID theft, DOJ says. The full extent of the scheme may never be uncovered, a judge says.”]
Source: https://www.csoonline.com/article/2127856/id-thief-sentenced-to-more-than-16-years-in-prison.html